Installation of a combined Raman and AFM microscope as a sample environment for Nuclear Resonance Scattering at P01,
نویسندگان
چکیده
A combined Raman and atomic force microscope (AFM) microscope has been installed at beamline P01, PETRA III, DESY in Hamburg and is now available for all users of this beamline. With this unique setup 57 Fe nuclear resonance scattering and simultaneously performed Raman or Atomic Force Microscopy experiments are possible. Here we report on technical details of this new sample environment and on first tests with respect to the study of microstructures of spin crossover materials.
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